DocumentCode
150668
Title
Extreme silicon RFICs for phased-array applications
Author
Rebeiz, Gabriel M.
Author_Institution
Univ. of California, San Diego, La Jolla, CA, USA
fYear
2014
fDate
19-23 Jan. 2014
Firstpage
25
Lastpage
28
Abstract
This invited talk will present the latest work on silicon RFICs for phased-array applications with emphasis on very large chips with built-in-self-test capabilities. These chips can drastically reduce the cost of microwave and millimeter-wave phased arrays by combining many elements on the same chip, together with digital control. The chips also allow a much easier packaging scheme using either a multi-layer PCB or wafer-level packages. If available, I will also present a millimeter-wave wafer-scale phased array where the entire phased array is built on a single wafer, with layout crossing over the standard reticle size. Several examples from 30 GHz to 94 GHz will be given, together with their packaging and measured antenna patterns.
Keywords
antenna phased arrays; antenna radiation patterns; built-in self test; digital control; elemental semiconductors; printed circuit manufacture; radiofrequency integrated circuits; silicon; wafer level packaging; wafer-scale integration; Si; antenna patterns; built-in-self-test capabilities; digital control; frequency 30 GHz to 94 GHz; microwave phased arrays; millimeterwave phased arrays; millimeterwave wafer-scale phased array; multilayer PCB; packaging scheme; phased-array applications; silicon RFIC; very large chips; wafer-level packages; Antenna measurements; Built-in self-test; Phased arrays; Radiofrequency integrated circuits; Silicon; Silicon germanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Silicon Monolithic Integrated Circuits in Rf Systems (SiRF), 2014 IEEE 14th Topical Meeting on
Conference_Location
Newport Beach, CA
Type
conf
DOI
10.1109/SiRF.2014.6828513
Filename
6828513
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