DocumentCode :
15067
Title :
Boost Converter With SiC JFETs: Comparison With CoolMOS and Tests at Elevated Case Temperature
Author :
Guedon, F. ; Singh, Sushil ; McMahon, R. ; Udrea, F.
Author_Institution :
Department of Engineering, University of Cambridge, Cambridge, U.K.
Volume :
28
Issue :
4
fYear :
2013
fDate :
Apr-13
Firstpage :
1938
Lastpage :
1945
Abstract :
The emergence of hybrid electric vehicles (HEVs) has driven an increasing demand for high power densities in power converters. Silicon carbide (SiC) is a candidate of choice to meet this demand, and it has, therefore, been the object of a growing interest over the past decade. The boost converter (step-up converter) is an essential part of the typical powertrain of an HEV. This paper presents a scaled experiment in which a boost converter with a SiCjunction field-effect transistor is compared to the same converter with a silicon (Si) superjunction metal oxide semiconductor field-effect transistor (MOSFET). In a first part, classic heatsinks are used; in a second part, the case of the transistors is maintained at 105 ^{\\circ} C to mimic a cooling by radiator water. In both cases, results show a clear advantage for SiC.
Keywords :
JFETs; Junctions; Logic gates; Silicon; Silicon carbide; Temperature measurement; Boost converter; CoolMOS; SiC junction field-effect transistor (JFET); elevated temperature;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2012.2201753
Filename :
6208891
Link To Document :
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