Title :
Single Event Transient Suppressor for Flip-Flops
Author :
She, Xiaoxuan ; Li, N. ; Carlson, R. Mariad ; Erstad, D. Oliswy
Author_Institution :
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
Abstract :
Some single event upset (SEU)-hardened flip-flops cannot mitigate single event transients (SET) that come from the upstream combinational circuits and propagate to the data inputs of flip-flops near the capturing clock edge. This paper presents a SET suppressor that can mitigate such SETs. By adjusting the clock edge timing so that the flip-flop captures data when the data returns to a correct state, the SET suppressor protects a flip-flop against SETs. The clock edge timing adjustment results in flip-flop delay. However, the SET suppressor almost does not introduce flip-flop delay when no SET occurs near the capturing clock edge, which is a great majority of time.
Keywords :
combinational circuits; flip-flops; radiation hardening (electronics); SEU-hardened flip-flops; clock edge timing; flip-flop delay; single event transient suppressor; single event upset; upstream combinational circuits; Flip-flop; hardened by design; single event transient (SET); single event upset (SEU);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2010.2049029