Title :
Impact of Switched Dose-Rate Irradiation on the Response of the LM124 Operational Amplifier to Pulsed X-Rays
Author :
Roche, Nicolas J -H ; Dusseau, Laurent ; Mekki, Julien ; Perez, Stephanie ; Vaillé, Jean-Roch ; Velo, Yago Gonzalez ; Boch, Jérome ; Saigné, Frédéric ; Marec, Ronan ; Calvel, Philippe ; Bezerra, Francoise ; Auriel, Gérard ; Azaïs, Bruno ; Buchner, Stephen
Author_Institution :
IES, Univ. Montpellier 2, Montpellier, France
fDate :
6/1/2011 12:00:00 AM
Abstract :
The Synergistic effect between TID and ATREEs (Analog Transient Radiation Effects on Electronics) in an operational amplifier (opamp) (LM124) is investigated for three different bias configurations. An accelerated irradiation technique is used to study these synergistic effects. The impact of TID on ATREEs is found to be identical regardless of whether the irradiation is performed at low dose rate or whether the dose rate is switched from high to low using the Dose Rate Switching (DRS) technique. The correlation between the deviations of the opamp´s electrical parameters and the changes of ATREE widths is clearly established.
Keywords :
X-ray effects; operational amplifiers; radiation hardening (electronics); ATREE; DRS technique; LM124 operational amplifier; TID; analog transient radiation effects on electronics; dose rate switching technique; pulsed X-rays; switched dose-rate irradiation; synergistic effect; Degradation; Inverters; Radiation effects; Shape; Switches; Transient analysis; X-rays; Analog circuits; bipolar circuits; integrated circuit radiation effects; ionizing dose; single event transients; total dose effects; transient radiation effects; transient response; x-ray effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2136360
