Title :
Virtual test reduces semiconductor product development time
Author :
Hogan, T. ; Heffernan, D.
Author_Institution :
Test Dev. Eng., Analog Devices, Limerick, Ireland
fDate :
6/1/2001 12:00:00 AM
Abstract :
In the semiconductor industry´s evolutionary life cycle, the speed at which products are introduced to the market-space is key to the competitive success of individual companies. The semiconductor industry is classed as a fast-changing industry in which product technology, manufacturing process technology and industry organisation need to be continuously updated in relatively short cycle times. This paper looks at the test engineering aspect of the IC (integrated circuit) product development process and describes how an emerging ´virtual test´ methodology can be effectively, applied to reduce the overall product development time for semiconductor devices
Keywords :
integrated circuit testing; product development; competitive success; industry organisation; integrated circuit product development; integrated circuit testing; manufacturing process technology; product technology; semiconductor devices; semiconductor industry; semiconductor product development time reduction; virtual test;
Journal_Title :
Engineering Science and Education Journal
DOI :
10.1049/esej:20010305