Title :
Thin-film power-density meter for millimeter wavelengths
Author :
Lee, Karen A. ; Guo, Yong ; Stimson, Philip A. ; Potter, Kent A. ; Chiao, Jung-Chih ; Rutledge, David B.
Author_Institution :
Div. of Eng. & Appl. Sci., California Inst. of Technol., Pasadena, CA, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
A quasi-optical power density meter for millimeter and submillimeter wavelengths has been developed. The device is a 2-cm2 thin-film bismuth bolometer deposited on a mylar membrane. The resistance responsivity is 150 Ω/W, and the time constant is 1 min. The meter is calibrated at DC. The bolometer is much thinner than a wavelength, and can thus be modeled as a lumped resistance in a transmission-line equivalent circuit. The absorption coefficient is 0.5 for 189-Ω/square film. The power-density meter has been used to measure absolute power densities for millimeter-wave antenna efficiency measurements. Absolute power densities of 0.5 mW/cm2 have been measured to an estimated accuracy of 5%
Keywords :
bolometers; microwave antennas; microwave measurement; power measurement; MM wave; absorption coefficient; antenna efficiency; millimeter wavelengths; mylar membrane; quasi-optical power density meter; resistance responsivity; subMM wave; submillimeter wavelengths; thin film Bi bolometer; time constant; transmission-line equivalent circuit; Antenna measurements; Bolometers; Density measurement; Electrical resistance measurement; Millimeter wave devices; Millimeter wave measurements; Power measurement; Thin film circuits; Transistors; Wavelength measurement;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
