• DocumentCode
    1507582
  • Title

    A Practical, Innovative Method for Electro-Static Discharge Data Analysis

  • Author

    Chien, Wei-Ting Kary ; Yang, Siyuan Frank

  • Author_Institution
    Corp. Quality & Reliability Center, Semicond. Manuf. Int. Corp., Shanghai, China
  • Volume
    59
  • Issue
    2
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    440
  • Lastpage
    446
  • Abstract
    A practical method to identify outliers in interval data mixed with some right censored data is proposed. It is based on a simple concept of determining the probability that a deviation of an outlier, by chance, from the probability line which was fitted by the data set with the outlier deleted. The median rank method is employed to determine its sample failing fraction to construct the probability plot. A special treatment is employed to treat the suspect outlier when making probability plots and regression with the suspect outlier deleted. The Fisher Matrix is used to determine the confidence bound, and to assist the estimation of the probability. A critical interval is then defined based on the calculated confidence bound in ESD (Electrostatic Discharge) data, and then the complicated methods are simplified with a simple linear regression using Excel to determine the distance that the possible outlier deviates from the regression line. The remaining work is to simply compare the distance with the critical interval before making a decision about what to do next, such as re-do ESD tests or refine ESD circuits, perform troubleshooting on the manufacturing process, and/or implement process changes for the IC product´s ESD performance improvement.
  • Keywords
    data analysis; electrostatic discharge; integrated circuit reliability; integrated circuit testing; matrix algebra; regression analysis; ESD data; Fisher matrix; electrostatic discharge data analysis; integrated circuit reliability; integrated circuit testing; interval data; median rank method; outlier detection; probability plotting; regression line; right censored data; Biological system modeling; Circuit simulation; Circuit testing; Data analysis; Electrostatic discharge; Humans; Integrated circuit modeling; Integrated circuit testing; Protection; Voltage; electro-static discharge/damage (ESD); interval data; median rank equation; outlier detection; probability plotting; right censored data; suspended;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2010.2048680
  • Filename
    5475448