Title :
Reliability estimation for PLC-type optical splitters
Author :
Hanafusa, H. ; Hanawa, F. ; Hibino, Y. ; Nozawa, T.
Author_Institution :
NTT Opto-Electron. Labs., Ibaraki, Japan
fDate :
1/30/1997 12:00:00 AM
Abstract :
An accelerated lifetest on PLC-type optical splitters is performed in damp heat environments with different temperatures and humidities. The Weibull distribution is used to analyse the times-to-failure of the splitters statistically. The activation energy of the failure is derived as 1.39 eV. The hazard rate of the splitters is estimated to be <0.6 fit over a period of 30 years at 25°C 90% RH
Keywords :
Weibull distribution; integrated optics; life testing; optical elements; reliability; PLC-type optical splitter; Weibull distribution; accelerated lifetest; activation energy; hazard rate; humidity effect; reliability; statistical analysis; temperature effect; time-to-failure;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970138
