• DocumentCode
    1507918
  • Title

    Threshold Voltage Tuning of Low-Voltage Organic Thin-Film Transistors

  • Author

    Shang, Liwei ; Ji, Zhuoyu ; Wang, Hong ; Chen, Yingpin ; Lu, Congyan ; Liu, Xin ; Han, Maixing ; Liu, Ming

  • Author_Institution
    Key Lab. of Nanofabrication & Novel Devices Integration Technol., Chinese Acad. of Sci., Beijing, China
  • Volume
    58
  • Issue
    7
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    2127
  • Lastpage
    2134
  • Abstract
    There are two critical issues involved in voltages of organic thin-film transistors (OTFTs), i.e., high operating voltages Vop and random distributed threshold voltages VTH, which lead to high power consumption and unreliable logic function in organic integrated circuits, respectively. This paper demonstrates that both issues can be solved in a single OTFT device by using very thin insulator films. The operating voltages could be reduced to be less than 3 V, without lowering the mobility and the on/off ratio. Using light-enhanced bias stress effect, the threshold voltages can be tuned into the range of -4 to 4 V in OTFTs with SiO2 or Al2O3 as dielectric films, demonstrating that light-enhanced bias stress effect in OTFTs is independent of the dielectric material. The ΔVTH/Vop ratio is about 3, which is one of the largest threshold-voltage-shifting ratios. It is found that the threshold voltage shifting has a linear relationship with the bias voltage and the light illumination time. This tuning technology is a post fabrication and noninvasive method with negligible influence on the mobility and on/off current ratios.
  • Keywords
    aluminium compounds; low-power electronics; organic semiconductors; silicon compounds; thin film transistors; Al2O3; SiO2; dielectric films; high operating voltages; high power consumption; light enhanced bias stress effect; low-voltage organic thin film transistors; organic integrated circuits; post fabrication; random distributed threshold voltages; threshold voltage tuning; tuning technology; unreliable logic function; Dielectrics; Lighting; Organic thin film transistors; Stress; Threshold voltage; Tuning; Low voltage; organic thin-film transistors (OTFTs); photosensitive; threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2136436
  • Filename
    5759767