• DocumentCode
    1508035
  • Title

    Investigation on the Single Event Burnout Sensitive Volume Using Two-Photon Absorption Laser Testing

  • Author

    Darracq, Frédéric ; Mbaye, Nogaye ; Azzopardi, Stéphane ; Pouget, Vincent ; Lorfevre, Eric ; Bezerra, Françoise ; Lewis, Dean

  • Author_Institution
    IMS laboratory (CNRS UMR5218), University Bordeaux 1, Talence, France
  • Volume
    59
  • Issue
    4
  • fYear
    2012
  • Firstpage
    999
  • Lastpage
    1006
  • Abstract
    The Single Event Burnout sensitive volume of power MOSFETs is investigated using the laser Two-Photon Absorption Technique. A first discussion about the efficiency of this technique is given.
  • Keywords
    Absorption; Laser beams; Lasers; Measurement by laser beam; Probes; Sensitivity; Substrates; Sensitive volume; Single Event Burnout; Two Photon Absorption; vertical power MOSFET;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2192449
  • Filename
    6194355
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1508035