Title :
A finite element method (FEM) analysis of a shielded velocity-matched Ti:LiNbO/sub 3/ optical modulator
Author :
Kawano, Kenji ; Noguchi, Kazuto ; Kitoh, Tsutomu ; Miyazawa, Hiroshi
Author_Institution :
NTT Opto-Electron. Lab., Kanagawa, Japan
Abstract :
Shielded velocity-matched Ti:LiNbO/sub 3/ Mach-Zehnder optical modulators are analyzed based on the second-order triangular-element quasi-transverse-electromagnetic finite element method. The relationship between the traveling-wave electrode thickness and the optimum overlaid layer thickness is numerically investigated. The modulation bandwidth of the shielded velocity-matched optical modulator is greatly improved by incorporating the traveling-wave electrode thickness into the design of the optimum overlaid layer thickness in the 1.5 mu m wavelength region.<>
Keywords :
electro-optical devices; finite element analysis; light interferometers; lithium compounds; optical communication equipment; optical modulation; optical waveguides; titanium; 1.5 micron; Mach-Zehnder optical modulators; finite element method analysis; modulation bandwidth; optical waveguide; optimum overlaid layer thickness; second-order triangular-element quasi-transverse-electromagnetic finite element method; shielded velocity matched LiNbO/sub 3/:Ti optical modulator; traveling-wave electrode thickness; wavelength region; Bandwidth; Buffer layers; Electrodes; Finite element methods; Optical buffering; Optical films; Optical modulation; Optical waveguides; Substrates; Support vector machines;
Journal_Title :
Photonics Technology Letters, IEEE
