• DocumentCode
    1508220
  • Title

    A simulated annealing algorithm for optimizing RF power efficiency in coupled-cavity traveling-wave tubes

  • Author

    Wilson, Jeffrey D.

  • Author_Institution
    NASA Lewis Res. Center, Cleveland, OH, USA
  • Volume
    44
  • Issue
    12
  • fYear
    1997
  • fDate
    12/1/1997 12:00:00 AM
  • Firstpage
    2295
  • Lastpage
    2299
  • Abstract
    Decreasing the radio frequency (RF) phase velocity in the output section of a traveling-wave tube (TWT) is a technique commonly used to increase RF power efficiency. In order to optimize the profile of the phase velocity, a simulated annealing algorithm has been developed and implemented into the NASA multidimensional large-signal coupled-cavity TWT computer model. This algorithm allows the determination of the lengths of the individual cavities at the end of the output section necessary to provide the optimized phase velocity profile. The resulting nonlinear computer-generated phase velocity profile provides a design with optimized RF efficiency. In this paper, the optimization algorithm is described and computational results are shown. These results indicate an increase in center-frequency RF efficiency from 7.1 to 13.5% for a V-band coupled-cavity TWT
  • Keywords
    cavity resonators; computer aided analysis; electrical engineering computing; millimetre wave tubes; simulated annealing; travelling wave tubes; velocity; NASA TWT computer model; RF phase velocity profile; RF power efficiency optimisation; V-band TWT; cavity length determination; coupled-cavity TWT; coupled-cavity computer model; multidimensional large-signal model; nonlinear computer-generated velocity profile; optimization algorithm; simulated annealing algorithm; traveling-wave tubes; Circuit simulation; Coupling circuits; Design optimization; Electron beams; Input variables; Multidimensional systems; NASA; Radio frequency; Simulated annealing; Solids;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.644656
  • Filename
    644656