DocumentCode
1508363
Title
Analytical evaluation of dielectric breakdown test based on one-minute step-up method
Author
Tsuboi, Toshihiro ; Takami, Jun ; Okabe, Shigemitsu ; Hirose, Hideo ; Tsuru, Kotaro
Author_Institution
R&D Center, Tokyo Electr. Power Co., Yokohama, Japan
Volume
16
Issue
5
fYear
2009
fDate
10/1/2009 12:00:00 AM
Firstpage
1393
Lastpage
1396
Abstract
The authors previously pointed out that the results of insulation tests based on the one-minute step-up method deviate from the "true values". In the present study, these deviations are evaluated by numerical simulations. These deviations were found to exist not only under limited conditions in numerical simulations but to exist fundamentally on the one-minute step-up test method. This should be taken into consideration when making actual insulation designs.
Keywords
electric breakdown; insulation testing; dielectric breakdown test; insulation designs; insulation tests; numerical simulations; one-minute step-up method; Dielectric breakdown; Dielectrics and electrical insulation; Equations; History; Insulation testing; Insulator testing; Numerical simulation; Shape; Voltage; Weibull distribution; Power-frequency withstand voltage test, one-minute step-up method, reliability evaluation, Weibull distribution.;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2009.5293952
Filename
5293952
Link To Document