Title :
Probabilistic model for MV spark-gap characteristics with lightning induced overvoltage superimposed on AC voltage
Author :
Sabiha, Nehmdoh A. ; Lehtonen, Matti ; Tarhuni, Naser G. ; Hyvonen, P.
Author_Institution :
Fac. of Electron., Commun. & Autom., Helsinki Univ. of Technol., Espoo, Finland
fDate :
10/1/2009 12:00:00 AM
Abstract :
In this paper, the breakdown probability of MV spark-gaps is modeled using the Gaussian distribution function under an impulse voltage test in accordance with the IEC 60060-1 standard. The model is presented in the form of the well-known Gaussian tail probability. Accordingly, a modified probabilistic model is introduced to study the effect of impulse voltage superimposed on the AC voltage on the breakdown probability of MV spark-gaps. The modified model is verified using experimental data, where the experimental setup is arranged to generate a range of impulse voltages superimposed on the ac voltages. The results show evidence of the efficacy of the proposed probabilistic model. Furthermore, the proposed model is used to evaluate single-phase, two-phase and three-phase spark-gap breakdown probabilities in the case of lightning induced overvoltages. Finally, these breakdown probabilities are used along with the simplified Rusck expression to evaluate the performance of MV overhead lines above a perfectly conducting ground under lightning-induced voltages using a statistical approach.
Keywords :
Gaussian distribution; IEC standards; lightning protection; power overhead lines; spark gaps; AC voltage; Gaussian distribution function; Gaussian tail probability; IEC 60060-1 standard; MV overhead lines; MV spark-gap characteristics; breakdown probability; impulse voltage test; lightning induced overvoltage; probabilistic model; AC generators; Breakdown voltage; Gaussian distribution; IEC standards; Impulse testing; Lightning; Probability; Spark gaps; Tail; Voltage control; Spark-gap breakdown probability, distribution function, lightning induced overvoltage, statistical approach.;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2009.5293954