Title : 
Effects of surface/interface morphology on giant magnetoresistance and magnetic field sensitivity of NiO-based spin-valves
         
        
            Author : 
Han, De-Hua ; Zhu, Jian-Gang ; Judy, Jack H. ; Sivertsen, John M.
         
        
            Author_Institution : 
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
         
        
        
        
        
            fDate : 
9/1/1997 12:00:00 AM
         
        
        
        
            Abstract : 
The effects of surface/interface morphology on the giant magnetoresistance (GMR) and magnetic field sensitivity (MFS) of NiFe/Co/Cu/Co/NiFe/NiO/Si and Co/Cu/Co/NiO/Si bottom spin-valve films were studied. The NiO-based spin valves were fabricated on NiO films with different surface roughnesses. A GMR of 4.02% and a MFS of 0.83%/Oe were obtained from the spin-valves with a smoother surface/interface. A GMR of 5.46% and a MFS of 0.22%/Oe in low field and a GMR of 6.26% and a MFS of 0.16%/Oe in high field were obtained from the spin-valve films with a rougher surface/interface. It was found that the smoother the surface of the spin-valve films, the smaller the GMR but the larger the MFS. On the other hand, the rougher the surface of the spin-valve films, the larger the GMR but the smaller the MFS. The mechanism for surface/interface morphology affecting the GMR and MFS is also explored
         
        
            Keywords : 
giant magnetoresistance; interface structure; magnetic multilayers; nickel compounds; surface topography; Co/Cu/Co/NiO/Si; NiFe/Co/Cu/Co/NiFe/NiO/Si; NiO; NiO-based spin-valves; giant magnetoresistance; magnetic field sensitivity; surface roughnesses; surface/interface morphology; Force measurement; Giant magnetoresistance; Grain size; Magnetic field measurement; Magnetic films; Magnetic sensors; Rough surfaces; Spin valves; Surface morphology; Surface roughness;
         
        
        
            Journal_Title : 
Magnetics, IEEE Transactions on