Title : 
Self-tracking charge pump for fast-locking PLL
         
        
            Author : 
Chen, Yuanfeng ; Mak, Pui-In ; Zhou, Yangzhong
         
        
            Author_Institution : 
Inst. of Microelectron., Chinese Acad. of Sci., Beijing, China
         
        
        
        
        
        
        
            Abstract : 
Presented is a self-tracking charge pump (ST-CP) that can deliver a non-constant current over the output voltage range for a fast-locking phase-locked loop (PLL). It features a simple self-bias self-tracking architecture that can reduce, simultaneously, the PLL locking time and the current mismatch in charge and discharge phases. Experimentally verified in a 0.18 ??m CMOS process, the proposed ST-CP achieves 72% reduction of PLL locking time compared with the conventional one. The core occupies 30 ?? 60 ??m and draws 10 ??A at 1.8 V.
         
        
            Keywords : 
CMOS integrated circuits; charge pump circuits; phase locked loops; CMOS process; PLL locking time; current mismatch; fast-locking PLL; fast-locking phase-locked loop; nonconstant current; output voltage; self-bias self-tracking architecture; self-tracking charge pump; size 0.18 mum;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el.2010.3562