DocumentCode :
1508877
Title :
CAS-FEST 2010: Mitigating Variability in Near-Threshold Computing
Author :
Seok, Mingoo ; Chen, Gregory ; Hanson, Scott ; Wieckowski, Michael ; Blaauw, David ; Sylvester, Dennis
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Volume :
1
Issue :
1
fYear :
2011
fDate :
3/1/2011 12:00:00 AM
Firstpage :
42
Lastpage :
49
Abstract :
Near threshold computing has recently gained significant interest due to its potential to address the prohibitive increase of power consumption in a wide spectrum of modern VLSI circuits. This tutorial paper starts by reviewing the benefits and challenges of near threshold computing. We focus on the challenge of variability and discuss circuit and architecture solutions tailored to three different circuit fabrics: logic, memory, and clock distribution. Soft-edge clocking, body-biasing, mismatch-tolerant memories, asynchronous operation and low-skew clock networks are presented to mitigate variability in the near threshold VDD regime.
Keywords :
VLSI; clock distribution networks; clocks; VLSI circuit; asynchronous operation; body biasing; circuit fabric; clock distribution; low-skew clock network; mismatch-tolerant memory; near threshold computing; soft-edge clocking; variability; Clocks; Delay; Logic gates; Performance evaluation; Random access memory; Synchronization; Threshold voltage; Low voltage; near threshold computing; variability;
fLanguage :
English
Journal_Title :
Emerging and Selected Topics in Circuits and Systems, IEEE Journal on
Publisher :
ieee
ISSN :
2156-3357
Type :
jour
DOI :
10.1109/JETCAS.2011.2135550
Filename :
5762379
Link To Document :
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