A New Measurement System for the Perpendicular Complex Permittivity to DUT Sheet by Stripline Simulation

The relative dielectric constant εr is calculated by quasi-static and frequency-dependent hybrid-mode analysis of two layers of dielectric materials (a sample material and a resonator base material) after measuring the rate of change of the resonating frequency of a sheet material under test sandwiched between a sheet metal and a calibrated stripline resonator. This method corrects the fringing effect of the resonator by using two resonators that have slightly different resonating frequencies. In the present study, tan δ is calculated by balancing the conductor loss. The features of this method are as follows. 1) Measurement of εr and tan δ is accurate. 2) Measurement can occur at several frequencies simultaneously. 3) Measurement can be made of εr and tan δ in the E direction perpendicular to the sheet material, e.g., a printed circuit board. 4) A metal pattern is not required. Only the sheet material under test is necessary. 5) Measurement provides accurate data since there is no radiation loss. This method is useful for measurement in the 0.5-14-GHz range, calculated at multiple frequencies. Fully automatic calculation can be achieved by computer analysis through connection to a network analyzer.