DocumentCode :
1509036
Title :
Stability testing of 2-D discrete linear systems by telepolation of an immittance-type tabular test
Author :
Bistritz, Yuval
Author_Institution :
Dept. of Electr. Eng. Syst., Tel Aviv Univ., Israel
Volume :
48
Issue :
7
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
840
Lastpage :
846
Abstract :
A new procedure for deciding whether a bivariate (two-dimensional, 2-D) polynomial with real or complex coefficients does not vanish in the closed exterior of the unit bi-circle (is “2-D stable”) is presented. It simplifies a recent immittance-type tabular stability test for 2-D discrete-time systems that creates for a polynomial of degree (n 1, n2) a sequence of n2 (or n1 ) centre-symmetric 2-D polynomials (the “2-D table”) and requires the testing of only one last one dimensional (1-D) symmetric polynomial of degree 2n1n2 for no zeros on the unit circle. It is shown that it is possible to bring forth (to “telescope”) the last polynomials by interpolation without the construction of the 2-D table. The new 2-D stability test requires an apparently unprecedentedly low count of arithmetic operations. It also shows that stability of a 2-D polynomial of degree (n1, n2) is completely determined by n1n2+1 stability tests (of specific form) of 1-D polynomials of degrees n1 or n2 for the real case (or 2n1n2+1 polynomials in the complex cases)
Keywords :
circuit stability; circuit testing; discrete time systems; interpolation; linear systems; multidimensional systems; poles and zeros; polynomials; stability criteria; two-dimensional digital filters; 2-D discrete linear systems; 2D digital filter; bivariate polynomial; centre-symmetric 2-D polynomials; immittance-type tabular test; low arithmetic operation count; multidimensional systems; one dimensional symmetric polynomial testing; stability criteria; stability testing; telepolation; unit bi-circle; unit circle; zeros; Arithmetic; Digital filters; Interpolation; Linear systems; Multidimensional systems; Polynomials; Radar imaging; Stability criteria; System testing; Two dimensional displays;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/81.933325
Filename :
933325
Link To Document :
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