Title :
A new 1 MHz-2 GHz permeance meter for metallic thin films
Author :
Yamaguchi, M. ; Yabukami, S. ; Arai, K.I.
Author_Institution :
Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
fDate :
9/1/1997 12:00:00 AM
Abstract :
We have developed a permeance meter in the 1 MHz-2 GHz range using a shielded loop type pickup coil. The effect of grounding between drive coil and pickup coil was analyzed using time domain reflectometry (TDR). The grounding increased the output voltage and eliminated the multiple reflections in the drive coil. Using the grounding, magnetic thin film permeance can be measured accurately over a wide frequency range. The complex permeance is shown of a l μm thick Co85Nb12 Zr3 film
Keywords :
UHF measurement; amorphous magnetic materials; cobalt alloys; coils; earthing; ferromagnetic materials; magnetic permeability; magnetic permeability measurement; magnetic shielding; magnetic thin films; metallic glasses; metallic thin films; niobium alloys; time-domain reflectometry; zirconium alloys; 1 MHz to 2 GHz; 1 mum; Co85Nb12Zr3; Co85Nb12Zr3 film; TDR; drive coil; grounding; magnetic thin film permeance; metallic thin films; multiple reflections; output voltage; permeance meter; shielded loop type pickup coil; time domain reflectometry; wide frequency range; Coils; Frequency measurement; Grounding; Magnetic analysis; Magnetic films; Reflection; Reflectometry; Time domain analysis; Transistors; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
