A new 1 MHz-2 GHz permeance meter for metallic thin films

Author

Yamaguchi, M. ; Yabukami, S. ; Arai, K.I.

Author_Institution

Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan

Volume

33

Issue

5

fYear

1997

fDate

9/1/1997 12:00:00 AM

Firstpage

3619

Lastpage

3621

Abstract

We have developed a permeance meter in the 1 MHz-2 GHz range using a shielded loop type pickup coil. The effect of grounding between drive coil and pickup coil was analyzed using time domain reflectometry (TDR). The grounding increased the output voltage and eliminated the multiple reflections in the drive coil. Using the grounding, magnetic thin film permeance can be measured accurately over a wide frequency range. The complex permeance is shown of a l μm thick Co₈₅Nb₁₂Zr₃ film

Keywords

UHF measurement; amorphous magnetic materials; cobalt alloys; coils; earthing; ferromagnetic materials; magnetic permeability; magnetic permeability measurement; magnetic shielding; magnetic thin films; metallic glasses; metallic thin films; niobium alloys; time-domain reflectometry; zirconium alloys; 1 MHz to 2 GHz; 1 mum; Co₈₅Nb₁₂Zr₃; Co₈₅Nb₁₂Zr₃ film; TDR; drive coil; grounding; magnetic thin film permeance; metallic thin films; multiple reflections; output voltage; permeance meter; shielded loop type pickup coil; time domain reflectometry; wide frequency range; Coils; Frequency measurement; Grounding; Magnetic analysis; Magnetic films; Reflection; Reflectometry; Time domain analysis; Transistors; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.619516

Filename

619516