• DocumentCode
    1509336
  • Title

    A study of the discharge phenomena of rhodium-plated contact reed switches

  • Author

    Kobayashi, Tatsuo ; Hinohara, Kunio ; Kawakita, Chihiro

  • Author_Institution
    Oki Electr. Ind. Co. Ltd., Tokyo, Japan
  • Volume
    14
  • Issue
    1
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    20
  • Lastpage
    22
  • Abstract
    Rhodium-plated contact reed switches have been used in various fields that require high reliability, such as measurement and control. To attain high breakdown voltage, the inside of the reed switch glass tube is placed under high pressure or in vacuum. The discharge phenomena of high breakdown voltage reed switches, such as the pressurized reed switch and vacuum reed switch, were studied, and the discharge phenomena of general-purpose reed switches were investigated with respect to their basic mechanism and reactions. In the course of this study, the contact surfaces were analyzed after discharge, assuming that the carrier in the discharge must remain on them. The analysis revealed that the nitrogen cation and oxygen anion serve as carriers in the discharge for the pressurized reed switch and general-purpose reed switch. In the vacuum reed switch the oxygen anion triggers the discharge as a carrier
  • Keywords
    electrical contacts; reed relays; rhodium; surface discharges; Rh; breakdown voltage; contact surfaces; discharge phenomena; glass tube; pressurized reed switch; reed switches; reliability; vacuum reed switch; Contacts; Electron tubes; Glass; Information analysis; Nitrogen; Pressure control; Surface discharges; Switches; Switching circuits; Vacuum breakdown;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.76504
  • Filename
    76504