Normal force reduction in electronic circuits

Author

Stennett, Neil A. ; Ireland, Tim P. ; Campbell, David S.

Author_Institution

Dept. of Electron. & Electr. Eng., Loughborough Univ. of Technol., UK

Volume

14

Issue

1

fYear

1991

fDate

3/1/1991 12:00:00 AM

Firstpage

45

Lastpage

49

Abstract

Elevated temperature heat-aging tests were performed on dual cantilever beam gold-plated-over-nickel, phosphor bronze electrical contacts. The normal force provided by the beam was directly measured before and after heat aging. A series of curves relating change of normal force with time was obtained for the temperature range 100-200°C. These curves showed that the normal force reduces with time. The rate of this reduction was found to increase with elevated temperature. The results of the tests are used to develop an empirical relationship for the behavior of the normal force with time and temperature

Keywords

ageing; electrical contacts; gold; nickel; tin alloys; 100 to 200 degC; Au-Ni-SnPFePbZn; dual cantilever beam; electrical contacts; empirical relationship; heat-aging tests; normal force; Aging; Circuit testing; Contacts; Electronic circuits; Force measurement; Performance evaluation; Phosphors; Resistance heating; Structural beams; Temperature;

fLanguage

English

Journal_Title

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on

Publisher

ieee

ISSN

0148-6411

Type

jour

DOI

10.1109/33.76509

Filename

76509