Title :
Magnetic and structural properties of Sm2Fe10Co7/MxCy thin films
Author :
Al-Omari, I.A. ; Cunningham, N.J. ; Sellmyer, D.J.
Author_Institution :
Dept. of Appl. Phys. Sci., Jordan Univ. of Sci. & Technol., Irbid, Jordan
fDate :
9/1/1997 12:00:00 AM
Abstract :
The structural and magnetic properties of Sm2Fe10 Co7/MxCy (M=Al and Si; x⩾0 and y⩾0) multilayer films with Ta underlayers and overlayers before and after annealing at 700°C for 5-12 min have been fabricated and studied. Structural studies show evidence of layer diffusion upon annealing. X-ray diffraction shows that the samples after annealing consist of a soft phase, α-Fe, and a hard phase with the 2-17-type structure. The samples studied have in-plane anisotropy with single hysteresis loops indicating that the two phases are strongly exchange coupled. After annealing, the coercivity of samples with AlxC y is found to increase with increasing AlxCy composition to a maximum of 3.3 kOe. The energy products for these samples are found to increase from 1.4 MGOe for SmFeCo to 8 MGOe for SmFeCo with AlxCy
Keywords :
X-ray diffraction; aluminium compounds; cobalt alloys; coercive force; exchange interactions (electron); ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic hysteresis; magnetic multilayers; samarium alloys; silicon compounds; surface diffusion; 5 to 12 min; 700 C; AlC; SiC; Sm2Fe10Co7; Sm2Fe10Co7/AlxCy thin films; Sm2Fe10Co7/SixCy thin films; X-ray diffraction; annealing; energy products; hard phase; in-plane anisotropy; layer diffusion; magnetic properties; multilayer films; single hysteresis loops; soft phase; strongly exchange coupled; structural properties; Anisotropic magnetoresistance; Annealing; Iron; Magnetic anisotropy; Magnetic films; Magnetic multilayers; Magnetic properties; Perpendicular magnetic anisotropy; Semiconductor films; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
