DocumentCode :
1509482
Title :
Thickness gauge uses electron beam
Volume :
81
Issue :
3
fYear :
1962
fDate :
3/1/1962 12:00:00 AM
Firstpage :
215
Lastpage :
215
Abstract :
A new thickness gauge, intended for use in industry for inspection and quality control, is at the prototype stage. Called an electron probe thickness gauge, it rapidly and nondestructively measures electroplates, ceramic enamels, and organic coatings. It detects deviations from specifications as small as 1 per cent in platings, sheet, films, or laminations. The chemical composition of the layer need be known only roughly.
Keywords :
Computers; Electron beams; Laser excitation; Laser radar; Pain; Power lasers; Thickness measurement;
fLanguage :
English
Journal_Title :
Electrical Engineering
Publisher :
ieee
ISSN :
0095-9197
Type :
jour
DOI :
10.1109/EE.1962.6446792
Filename :
6446792
Link To Document :
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