DocumentCode
1509855
Title
Measurements and analysis of PLL jitter caused by digital switching noise
Author
Larsson, Patrik
Author_Institution
Bell Labs., Holmdel, NJ, USA
Volume
36
Issue
7
fYear
2001
fDate
7/1/2001 12:00:00 AM
Firstpage
1113
Lastpage
1119
Abstract
When integrating analog and digital circuits onto a mixed-mode chip, power supply noise coupling is a major limitation on the performance of the analog circuitry. Several techniques exist for reducing the noise coupling, of which one of the cheapest is separating the power supply distribution networks for the analog and digital circuits. Noise coupling from a digital noise-generating circuit through the power supply/substrate into an analog phase-locked loop (PLL) is analyzed for three different power supply schemes. The main mechanisms for noise coupling are identified by comparing different PLLs and varying their bandwidths. It is found that the main cause of jitter strongly depends on the power supply configuration of the PLL. Measurements were done on mixed-mode designs in a standard 0.25-μm digital CMOS process with a low-resistivity substrate. The same circuits were also implemented with triple-well processing for comparisons
Keywords
equivalent circuits; integrated circuit modelling; integrated circuit noise; jitter; mixed analogue-digital integrated circuits; phase locked loops; 0.25 micron; PLL jitter; PLL power supply configuration; analog PLL; analog circuitry; digital CMOS process; digital switching noise; low-resistivity substrate; mixed-mode chip; power supply noise coupling; power supply schemes; triple-well processing; Circuit noise; Coupling circuits; Digital circuits; Integrated circuit measurements; Jitter; Noise reduction; Phase locked loops; Phase noise; Power supplies; Semiconductor device measurement;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/4.933469
Filename
933469
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