S-parameter broad-band measurements on-microstrip and fast extraction of the substrate intrinsic properties

Author

Hinojosa, J.

Author_Institution

Dept. de Electron., Tecnologia de Comput., y Proyectos, Univ. Politecnica de Cartagena, Spain

Volume

11

Issue

7

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

305

Lastpage

307

Abstract

A broad-band technique for determining the electromagnetic properties of isotropic film-shaped materials, which uses a microstrip line, is presented. Complex permittivity and permeability are computed from analytical equations and S-parameter measurements of microstrip cells propagating the dominant mode. Measured /spl epsiv//sub r/ and μ/sub r/ data for several materials are presented between 0.05 GHz and 40 GHz. This technique shows a good agreement between measured and predicted data.

Keywords

S-parameters; magnetic permeability measurement; microstrip lines; microwave measurement; permittivity measurement; substrates; 0.05 to 40 GHz; S-parameter measurement; broadband technique; complex permittivity; electromagnetic properties; isotropic film material; magnetic permeability; microstrip line substrate; parameter extraction; Dielectric substrates; Electromagnetic measurements; Equations; Frequency; Impedance; Magnetic analysis; Microstrip; Permeability measurement; Permittivity measurement; Scattering parameters;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/7260.933779

Filename

933779