Title :
High reliability photodetector with integral bandpass filter for receivers in passive optical networks
Author :
Skrimshire, C P ; Learmouth, M D ; Hewett, N.P. ; Reid, I.
Author_Institution :
British Telecom Res. Labs., Ipswich, UK
fDate :
6/1/1991 12:00:00 AM
Abstract :
A novel integrated dielectric filter-photodiode is reported, together with the first results of reliability testing of the device. The filter-photodiode has been designed as a low-cost demultiplexing element for use in passive optical local networks. It combines an evaporated multilayer filter structure and a conventional planar InGaAs p-i-n photodiode in a single device. Results of initial reliability stress-tests indicate that good reliability can be expected from the device in service, even when operated in a non-hermetic package
Keywords :
band-pass filters; integrated optoelectronics; multiplexing equipment; optical communication equipment; p-i-n diodes; photodetectors; photodiodes; semiconductor device testing; evaporated multilayer filter structure; integral bandpass filter; integrated dielectric filter-photodiode; local networks; low-cost demultiplexing element; nonhermetic package; passive optical networks; photodetector; planar InGaAs p-i-n photodiode; receivers; reliability testing; stress-tests;
Journal_Title :
Optoelectronics, IEE Proceedings J