State-of-the-Art Techniques for Detecting Transient Errors in Electrical Circuits

Author

Alves, Nuno

Author_Institution

Working toward his Ph.D. in electrical engineering at Brown University, under the direction of Iris Bahar.

Volume

30

Issue

3

fYear

2011

Firstpage

30

Lastpage

35

Abstract

A historical overview and the latest most promising techniques that allow the detection of a single transient error in a circuit, is presented. The following are presented: transient or soft errors; detecting transient errors with coding techniques: parity, Berger and Bose-Lin, Hamming encoding, error encoding in random logic; redundancy in time and space; error detection with logic synthesis; and logic implications.It is concluded that transient errors are a problem that are bound to get worse as new smaller technologies arise, and it is up to the designer to choose the most effective protective method for his needs.

Keywords

Hamming codes; coding errors; error detection; error detection codes; logic circuits; Hamming encoding; coding techniques; electrical circuits; error detection; error encoding; logic synthesis; random logic; single transient error; soft errors; transient error detection; Encoding; Logic functions; Logic gates; Redundancy; Transient analysis; Transistors;

fLanguage

English

Journal_Title

Potentials, IEEE

Publisher

ieee

ISSN

0278-6648

Type

jour

DOI

10.1109/MPOT.2011.940229

Filename

5764345