Title :
State-of-the-Art Techniques for Detecting Transient Errors in Electrical Circuits
Author_Institution :
Working toward his Ph.D. in electrical engineering at Brown University, under the direction of Iris Bahar.
Abstract :
A historical overview and the latest most promising techniques that allow the detection of a single transient error in a circuit, is presented. The following are presented: transient or soft errors; detecting transient errors with coding techniques: parity, Berger and Bose-Lin, Hamming encoding, error encoding in random logic; redundancy in time and space; error detection with logic synthesis; and logic implications.It is concluded that transient errors are a problem that are bound to get worse as new smaller technologies arise, and it is up to the designer to choose the most effective protective method for his needs.
Keywords :
Hamming codes; coding errors; error detection; error detection codes; logic circuits; Hamming encoding; coding techniques; electrical circuits; error detection; error encoding; logic synthesis; random logic; single transient error; soft errors; transient error detection; Encoding; Logic functions; Logic gates; Redundancy; Transient analysis; Transistors;
Journal_Title :
Potentials, IEEE
DOI :
10.1109/MPOT.2011.940229
