• DocumentCode
    1511266
  • Title

    Crystallization behavior of amorphous terfenol-D thin films

  • Author

    Loveless, M. ; Guruswamy, S. ; Shield, J.E.

  • Author_Institution
    Dept. of Metall. Eng., Utah Univ., Salt Lake City, UT, USA
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    3937
  • Lastpage
    3939
  • Abstract
    The annealing behavior of amorphous terfenol-D thin films is examined in this work. Amorphous thin films were prepared by DC magnetron sputter deposition from alloy targets. Differential scanning calorimetry of these films was performed in the temperature range 100-800°C. Based on DSC data annealing experiments were performed at 400, 550, 575, 600 and 650°C. X-ray diffraction shows RFe2 phase is formed when samples are annealed at 575-600°C. Other phases observed are Fe and rare earth oxide
  • Keywords
    X-ray diffraction; amorphous magnetic materials; annealing; crystallisation; dysprosium alloys; iron alloys; magnetic thin films; sputtered coatings; terbium alloys; thermal analysis; 100 to 800 degC; DC magnetron sputter deposition; TbDyFe; X-ray diffraction; amorphous terfenol-D thin films; annealing; differential scanning calorimetry; Amorphous magnetic materials; Amorphous materials; Annealing; Calorimetry; Crystallization; Iron; Sputtering; Temperature distribution; Transistors; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.619621
  • Filename
    619621
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1511266