• DocumentCode
    1511325
  • Title

    Investigation of Abnormal V_{\\rm TH}/V_{\\rm FB} Shifts Under Operating Conditions in Flash Memory Cells With $hbox{Al}_{2}hbox{O}_{3}$; Flash memory; charge trapping (CT); electron trap; floating gate (FG); high-$kappa$ dielectrics; instability; mobile charges;

  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2194294
  • Filename
    6196218
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1511325