• DocumentCode
    1511584
  • Title

    Self-Adaptive Write Circuit for Low-Power and Variation-Tolerant Memristors

  • Author

    Kwan-Hee Jo ; Chul-Moon Jung ; Kyeong-Sik Min ; Sung-Mo Kang

  • Author_Institution
    Sch. of Electr. Eng., Kookmin Univ., Seoul, South Korea
  • Volume
    9
  • Issue
    6
  • fYear
    2010
  • Firstpage
    675
  • Lastpage
    678
  • Abstract
    Memristive devices such as memristors that have been intensively studied for their possibilities as a strong candidate for future memories are known to have two problems. First, they need a large current in write operation, and second their process-V -temperature (PVT) variations are large compared with the conventional DRAM and FLASH memories. Moreover, the large writing current can be magnified with PVT variations. In this letter, a new write circuit is proposed to prevent unnecessary power loss by using a self-adjusting circuit for properly sizing the writing pulsewidth, thereby minimizing power consumption. The simulation results show that self-adjusting the pulsewidth can save power by 76% on average, compared to the conventional write circuit with a fixed pulsewidth.
  • Keywords
    DRAM chips; flash memories; low-power electronics; memristors; power consumption; self-adjusting systems; DRAM; FLASH memories; PVT variations; low-power electronics; power consumption; process-V-temperature variations; self-adaptive write circuit; self-adjusting circuit; variation-tolerant memristors; writing current; writing pulsewidth; Energy consumption; Flash memory; Magnetic circuits; Memristors; Permission; Pulse circuits; Random access memory; Space vector pulse width modulation; Voltage; Writing; Low-power memristors; resistive memories; self-adjustment circuit; variation-tolerant memristors;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2010.2052108
  • Filename
    5482157