DocumentCode :
1511933
Title :
Formation and annihilation of edge walls in thin-film Permalloy strips
Author :
Mattheis, Roland ; Ramstöck, Klaus ; McCord, Jeffery
Author_Institution :
Inst. fur Phys. Hochtechnol. e.V., Jena, Germany
Volume :
33
Issue :
5
fYear :
1997
fDate :
9/1/1997 12:00:00 AM
Firstpage :
3993
Lastpage :
3995
Abstract :
Comparison between magneto-resistance measurements and Kerr observations confirm that the formation and annihilation of edge walls in thin Permalloy strips, formed during rotation of an external field, is responsible for hysteresis in angular positioning sensors. The annihilation field required to avoid this unwanted behavior strongly depends on the strip cross section. Micromagnetic calculations assuming rectangular cross section yield higher absolute field values than those observed, but help to clarify the sensor behavior as field and material parameters are varied
Keywords :
Kerr magneto-optical effect; Permalloy; angular measurement; ferromagnetic materials; magnetic domain walls; magnetic hysteresis; magnetic sensors; magnetic switching; magnetic thin film devices; magnetic thin films; magnetoresistance; magnetoresistive devices; position measurement; Kerr observations; Ni81Fe19; absolute field values; edge wall annihilation; edge wall formation; external field rotation; hysteresis; magnetoresistance measurements; magnetoresistive angular positioning sensors; micromagnetic calculations; rectangular cross section; strip cross section; thin-film Permalloy strips; Anisotropic magnetoresistance; Bridge circuits; Magnetic anisotropy; Magnetic field measurement; Magnetic hysteresis; Magnetic sensors; Perpendicular magnetic anisotropy; Saturation magnetization; Strips; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.619640
Filename :
619640
Link To Document :
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