Title :
Inverse analysis for magnetic field source searching in thin film conductor
Author :
Midorikawa, Yoichi ; Ogawa, Junichi ; Doi, Tatsuya ; Hayano, Seiji ; Saito, Yoshifuru
Author_Institution :
Coll. of Eng., Hosei Univ., Tokyo, Japan
fDate :
9/1/1997 12:00:00 AM
Abstract :
Previously, we have proposed the sampled pattern matching (SPM) method solving for the inverse problem. In the present paper, we propose a generalized SPM method. The generalized SPM method makes it possible to estimate both the direction and magnitude of currents. We apply this new method to the current estimation in a thin film conductor. Numerical simulation suggests the validity of the method. As a result, this paper presents an effective methodology to estimate a current distribution in a thin film conductor
Keywords :
conductors (electric); current distribution; inverse problems; magnetic fields; pattern matching; thin films; current distribution; generalized sampled pattern matching; inverse analysis; magnetic field source searching; numerical simulation; thin film conductor; Conductive films; Current distribution; Inverse problems; Magnetic analysis; Magnetic fields; Magnetic films; Numerical simulation; Pattern matching; Scanning probe microscopy; Transistors;
Journal_Title :
Magnetics, IEEE Transactions on
