DocumentCode
1512062
Title
Magnetic resonance force microscopy with a permanent magnet on the cantilever
Author
Zhang, Z. ; Hammel, P.C.
Author_Institution
Los Alamos Nat. Lab., NM, USA
Volume
33
Issue
5
fYear
1997
fDate
9/1/1997 12:00:00 AM
Firstpage
4047
Lastpage
4049
Abstract
When the variation of the bias field is on the order of a few hundred gauss, permanent magnetic microparticles of Nd2Fe14B (NdFeB) mounted on atomic force microscopy (AFM) cantilevers generate much smaller nonresonance (NR) signals in the magnetic resonance force microscopy (MRFM) spectra than most soft magnetic thin films. However, the interactions of the NdFeB particle with the bias field cause an undesirable variation of the cantilever resonance frequency with changing bias field. Our model indicates the importance of minimizing the polarized moment of the magnetic tip and ensuring that the applied fields employed in the MRFM experiment be highly uniform
Keywords
magnetic force microscopy; magnetic resonance; permanent magnets; AFM cantilever; Nd2Fe14B; magnetic resonance force microscopy; permanent magnetic microparticles; Atomic force microscopy; Gaussian processes; Iron; Magnetic films; Magnetic force microscopy; Magnetic resonance; Micromagnetics; Neodymium; Permanent magnets; Signal generators;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.619658
Filename
619658
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