• DocumentCode
    1512062
  • Title

    Magnetic resonance force microscopy with a permanent magnet on the cantilever

  • Author

    Zhang, Z. ; Hammel, P.C.

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • Volume
    33
  • Issue
    5
  • fYear
    1997
  • fDate
    9/1/1997 12:00:00 AM
  • Firstpage
    4047
  • Lastpage
    4049
  • Abstract
    When the variation of the bias field is on the order of a few hundred gauss, permanent magnetic microparticles of Nd2Fe14B (NdFeB) mounted on atomic force microscopy (AFM) cantilevers generate much smaller nonresonance (NR) signals in the magnetic resonance force microscopy (MRFM) spectra than most soft magnetic thin films. However, the interactions of the NdFeB particle with the bias field cause an undesirable variation of the cantilever resonance frequency with changing bias field. Our model indicates the importance of minimizing the polarized moment of the magnetic tip and ensuring that the applied fields employed in the MRFM experiment be highly uniform
  • Keywords
    magnetic force microscopy; magnetic resonance; permanent magnets; AFM cantilever; Nd2Fe14B; magnetic resonance force microscopy; permanent magnetic microparticles; Atomic force microscopy; Gaussian processes; Iron; Magnetic films; Magnetic force microscopy; Magnetic resonance; Micromagnetics; Neodymium; Permanent magnets; Signal generators;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.619658
  • Filename
    619658