Title :
Surface potential imaging for magnetoresistive head development
Author :
Moreland, John ; Russek, S.E. ; Hopkins, P.F.
Author_Institution :
Div. of Electromagn. Technol., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
9/1/1997 12:00:00 AM
Abstract :
We demonstrate the first applications of scanning surface potential microscopy to magnetoresistive (MR) thin-film devices. Images are presented on active devices showing 2D maps of the surface potential of energized MR read-head stripes taken from the production line at the puck level. We have found that surface potential line scans (voltage vs. distance) along MR spin valve stripes show slight deviations from linearity, possibly due to nonuniform film magnetization along the length of the stripe
Keywords :
atomic force microscopy; giant magnetoresistance; magnetic domains; magnetic heads; magnetic multilayers; magnetic thin film devices; magnetisation; magnetoresistive devices; surface potential; surface topography measurement; voltage measurement; 2D maps; AFM potentiometry; GMR spin valve stripes; active devices; conductive AFM cantilever; energized MR read-head stripes; linearity deviations; magnetoresistive head; magnetoresistive thin-film devices; nonuniform film magnetization; puck level; scanning surface potential microscopy; surface potential imaging; surface potential line scans; surface topography image; Atomic force microscopy; Contacts; Magnetic heads; Magnetoresistance; Motion detection; Phase detection; Spin valves; Surface resistance; Surface topography; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
