Title :
A 2-V, 1.8-GHz BJT phase-locked loop
Author :
Chen, Wei-Zen ; Wu, Jieh-Tsorng
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fDate :
6/1/1999 12:00:00 AM
Abstract :
This paper describes the design of a bipolar junction transistor phase-locked loop (PLL) for ΣΔ fractional-N frequency-synthesis applications. Implemented in a 0.8-μm BiCMOS technology, the PLL can operate up to 1.8 GHz while consuming 225 mW of power from a single -2-V supply. The entire LC-tuned negative-resistance variable-frequency oscillator is integrated on the same chip. A differential low-voltage current-mode logic circuit configuration is used in most of the PLL´s functional blocks to minimize phase jitter and achieve low-voltage operation. The multimodulus frequency divider is designed to support multibit digital modulation. The new phase and frequency detector and loop filter contain only npn transistors and resistors and thus achieve excellent resolution in phase comparison. When phase locked to a 53.4-MHz reference clock, the measured phase noise of the 16-GHz output is -91 dBc/Hz at 10-kHz offset. The frequency switching time from 1.677 to 1.797 GHz is 150 μs. Die size is 4300×4000 μm2, including the passive loop filter
Keywords :
BiCMOS analogue integrated circuits; frequency synthesizers; jitter; negative resistance circuits; phase locked loops; variable-frequency oscillators; ΣΔ fractional-N frequency-synthesis applications; 0.8 micron; 1.8 GHz; 150 mus; 2 V; 225 mW; 53.4 MHz; BJT phase-locked loop; BiCMOS technology; LC-tuned negative-resistance variable-frequency oscillator; differential low-voltage current-mode logic circuit configuration; frequency switching time; low-voltage operation; multibit digital modulation; multimodulus frequency divider; passive loop filter; phase jitter; resolution; BiCMOS integrated circuits; Digital modulation; Frequency conversion; Frequency locked loops; Integrated circuit technology; Jitter; Logic circuits; Oscillators; Phase detection; Phase locked loops;
Journal_Title :
Solid-State Circuits, IEEE Journal of