• DocumentCode
    151247
  • Title

    A high temperature silicon carbide MOSFET power module with integrated silicon-on-insulator based gate drive

  • Author

    Zhiqiang Wang ; Xiaojie Shi ; Tolbert, Leon M. ; Wang, Fred ; Zhenxian Liang ; Costinett, Daniel ; Blalock, Benjamin J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
  • fYear
    2014
  • fDate
    14-18 Sept. 2014
  • Firstpage
    4373
  • Lastpage
    4380
  • Abstract
    This paper presents a board-level integrated silicon carbide (SiC) MOSFET power module for high temperature and high power density applications. Specifically, a silicon-on-insulator (SOI) based gate driver capable of operating at 200°C ambient temperature is designed and fabricated. The sourcing and sinking current capability of the gate driver are tested under various ambient temperatures. Also, a 1200 V/100 A SiC MOSFET phase-leg power module is developed utilizing high temperature packaging technologies. The static characteristics, switching performance, and short-circuit behavior of the fabricated power module are fully evaluated at different temperatures. Moreover, a buck converter prototype composed of the SOI gate driver and SiC power module is built for high temperature continuous operation. The converter is operated at different switching frequencies up to 100 kHz, with its junction temperature monitored by a thermo-sensitive electrical parameter (TSEP) and compared with thermal simulation results. The experimental results from the continuous operation demonstrate the high temperature capability of the power module at a junction temperature greater than 225°C.
  • Keywords
    MOSFET circuits; driver circuits; power MOSFET; semiconductor device packaging; silicon compounds; silicon-on-insulator; wide band gap semiconductors; MOSFET phase-leg power module; SOI; SiC; TSEP; board-level integrated silicon carbide MOSFET power module; buck converter prototype; current 100 A; high power density; high temperature continuous operation; high temperature packaging technology; high temperature silicon carbide MOSFET power module; integrated silicon-on-insulator based gate drive; junction temperature; short-circuit behavior; static characteristics; switching performance; temperature 200 degC; thermal simulation; thermo-sensitive electrical parameter; voltage 1200 V; Logic gates; MOSFET; Multichip modules; Silicon carbide; Switches; Temperature; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2014 IEEE
  • Conference_Location
    Pittsburgh, PA
  • Type

    conf

  • DOI
    10.1109/ECCE.2014.6953997
  • Filename
    6953997