• DocumentCode
    1512498
  • Title

    An On-Chip CMOS Relaxation Oscillator With Voltage Averaging Feedback

  • Author

    Tokunaga, Yusuke ; Sakiyama, Shiro ; Matsumoto, Akinori ; Dosho, Shiro

  • Author_Institution
    Strategic Semicond. Dev. Center, Panasonic Corp., Moriguchi, Japan
  • Volume
    45
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1150
  • Lastpage
    1158
  • Abstract
    An on-chip CMOS relaxation oscillator with voltage averaging feedback using a reference proportional to supply voltage is presented. A voltage-averaging feedback (VAF) concept is proposed to overcome conventional relaxation oscillator problems such as sensitivity to comparator delay, aging, and flicker noise of current sources. A test-chip with typical frequency of 14.0 MHz was fabricated in a 0.18 μm standard CMOS process and measured frequency variations of ±0.16 % for supply changes from 1.7 to 1.9 V and ±0.19% for temperature changes from -40 to 125°C. The prototype draws 25 μA from a 1.8 V supply, occupies 0.04 mm2, and achieves 7x reduction in accumulated jitter (at 1500th cycle) as compared to a oscillator without VAF.
  • Keywords
    CMOS integrated circuits; comparators (circuits); flicker noise; relaxation oscillators; comparator delay; current 25 muA; flicker noise; frequency 14.0 MHz; on-chip CMOS relaxation oscillator; size 0.18 micron; voltage 1.7 V to 1.9 V; voltage 1.8 V; voltage averaging feedback; 1f noise; Aging; CMOS process; Delay; Feedback; Frequency measurement; Measurement standards; Temperature sensors; Testing; Voltage-controlled oscillators; Frequency stability; MOSFET oscillators; jitter; oscillator noise; phase noise; relaxation oscillators;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2010.2048732
  • Filename
    5482523