Title :
An On-Chip CMOS Relaxation Oscillator With Voltage Averaging Feedback
Author :
Tokunaga, Yusuke ; Sakiyama, Shiro ; Matsumoto, Akinori ; Dosho, Shiro
Author_Institution :
Strategic Semicond. Dev. Center, Panasonic Corp., Moriguchi, Japan
fDate :
6/1/2010 12:00:00 AM
Abstract :
An on-chip CMOS relaxation oscillator with voltage averaging feedback using a reference proportional to supply voltage is presented. A voltage-averaging feedback (VAF) concept is proposed to overcome conventional relaxation oscillator problems such as sensitivity to comparator delay, aging, and flicker noise of current sources. A test-chip with typical frequency of 14.0 MHz was fabricated in a 0.18 μm standard CMOS process and measured frequency variations of ±0.16 % for supply changes from 1.7 to 1.9 V and ±0.19% for temperature changes from -40 to 125°C. The prototype draws 25 μA from a 1.8 V supply, occupies 0.04 mm2, and achieves 7x reduction in accumulated jitter (at 1500th cycle) as compared to a oscillator without VAF.
Keywords :
CMOS integrated circuits; comparators (circuits); flicker noise; relaxation oscillators; comparator delay; current 25 muA; flicker noise; frequency 14.0 MHz; on-chip CMOS relaxation oscillator; size 0.18 micron; voltage 1.7 V to 1.9 V; voltage 1.8 V; voltage averaging feedback; 1f noise; Aging; CMOS process; Delay; Feedback; Frequency measurement; Measurement standards; Temperature sensors; Testing; Voltage-controlled oscillators; Frequency stability; MOSFET oscillators; jitter; oscillator noise; phase noise; relaxation oscillators;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2010.2048732