• DocumentCode
    1513247
  • Title

    Bias and Precision of the fluoroBancroft Algorithm for Single Particle Localization in Fluorescence Microscopy

  • Author

    Shen, Zhaolong ; Andersson, Sean B.

  • Author_Institution
    Dept. of Mech. Eng., Boston Univ., Boston, MA, USA
  • Volume
    59
  • Issue
    8
  • fYear
    2011
  • Firstpage
    4041
  • Lastpage
    4046
  • Abstract
    The fluoroBancroft (FB) algorithm is an analytical solution to the position estimation problem in single molecule fluorescence microscopy. In this paper we derive a theoretical description of the bias and precision of the estimator for three dimensional estimation based on a stack of charge-coupled device (CCD) images and illustrate the results through realistic simulations. The results indicate that the algorithm exhibits a small bias that is driven primarily by modeling error and is dependent on the location of the source particle relative to the set of pixels used for estimation. In the shot noise limited case, the precision scales approximately as the inverse square root of the number of photons detected and as the inverse of the number of photons detected in the background noise limited case. The results are compared through simulation to the maximum-likelihood (ML) estimator based on the theoretical point spread function and found to have a similar performance. In general, the ML estimate had lower bias and variance, though at the lowest signal-to-noise ratio (SNR), FB outperformed ML. The FB algorithm executes approximately three to four orders-of-magnitude faster than the ML estimator and is well-suited for applications in which real-time results are needed.
  • Keywords
    charge-coupled devices; maximum likelihood estimation; optical microscopy; background noise limited case; charge-coupled device images; fluoroBancroft algorithm; maximum-likelihood estimator; modeling error; point spread function; position estimation; precision scales; shot noise limited case; signal-to-noise ratio; single molecule fluorescence microscopy; single particle localization; source particle; Maximum likelihood estimation; Noise measurement; Photonics; Pixel; Signal processing algorithms; Signal to noise ratio; Fluorescence microscopy; estimation; generalized inverse;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/TSP.2011.2152398
  • Filename
    5765550