DocumentCode :
1513373
Title :
10-Gb/s Planar InGaAs P-I-N Photodetectors
Author :
Wang, Y.S. ; Chang, Shoou-Jinn ; Tsai, C.L. ; Wu, Meng-Chyi ; Chiou, Yu-Zung ; Chang, S.P. ; Lin, W.
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
10
Issue :
10
fYear :
2010
Firstpage :
1559
Lastpage :
1563
Abstract :
The authors report the fabrication of high-performance planar InGaAs P-I-N buried heterostructure photodetectors (BH-PDs) by introducing mesa etching and refilling with semi-insulating InP. It was found that measured 3-dB bandwidth for the fabricated BH-PD was 12.4 GHz. For a given bandwidth of 1 kHz and a given bias of -5 V, it was found that noise equivalent powers our InGaAs P-I-N BH-PD were 6.05 × 10-14 W at 1310 nm and 4.36 × 10-14 W at 1550 nm, which correspond to normalize detectivity (D*) values of 2.3 × 1012 cmHz0.5W-1 and 3.2 × 1012 cmHz0.5W-1, respectively. It was also found that eye diagram data measured from the proposed BH-PD met with the requirements of the OC-192 standard.
Keywords :
III-V semiconductors; MOCVD; etching; photodetectors; semiconductor lasers; InGaAs; InP; MOCVD; bandwidth 1 kHz; bit rate 10 Gbit/s; buried heterostructure pin photodetector; frequency 12.4 GHz; mesa etching; metalorganic chemical vapor deposition; noise equivalent powers; pin photodetectors; refilling; wavelength 1310 nm; Buried heterostructure photodetector; InGaAs; noise;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2010.2046888
Filename :
5483091
Link To Document :
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