Title :
Embedded Capacitive Displacement Sensor for Nanopositioning Applications
Author :
Avramov-Zamurovic, Svetlana ; Dagalakis, Nicholas G. ; Lee, Rae Duk ; Yoo, Jae Myung ; Kim, Yong Sik ; Yang, Seung Ho
Author_Institution :
United States Naval Acad., Annapolis, MD, USA
fDate :
7/1/2011 12:00:00 AM
Abstract :
The scale of nano-sized objects requires very precise position determination. The state-of-the-art manipulators involve accurate nanometer positioning. This paper presents the design, fabrication process, and testing of a capacitance-based displacement sensor. The nanopositioner application required active sensing area dimensions to be hundreds of micrometers, making it necessary to develop sensor electrodes that are a few micrometers in size. The advantages of the sensor presented are its noninvasive method and very low voltage necessary for signal conditioning. Initial results suggest good linearity and sensitivity of 0.001 pF/μm, permitting a reliable displacement resolution on the order of 100 nm.
Keywords :
capacitive sensors; micrometry; nanofabrication; nanopositioning; nanosensors; embedded capacitive displacement sensor; fabrication process; micrometers; nanopositioning applications; noninvasive method; sensor electrodes; signal conditioning; size 100 nm; Capacitance; Capacitance measurement; Electrodes; NIST; Nanopositioning; Needles; Sensitivity; Capacitance measurement; displacement measurement; fabrication; nano-size positioners; nanotechnology; sensitivity;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2011.2126150