• DocumentCode
    1514024
  • Title

    A Unified Framework for Quadratic Measures of Independence

  • Author

    Seth, Sohan ; Rao, Murali ; Park, Il ; Príncipe, José C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
  • Volume
    59
  • Issue
    8
  • fYear
    2011
  • Firstpage
    3624
  • Lastpage
    3635
  • Abstract
    This paper proposes a unified framework for several available measures of independence by generalizing the concept of information theoretic learning (ITL). The key component of ITL is the use of inner product between two density functions as a measure of similarity between two random variables. We show that by generalizing the inner product using a symmetric strictly positive-definite kernel and by choosing appropriate kernels, it is possible to reproduce a number of popular measures of independence. This unified framework also allows the design of new strictly positive-definite kernels and corresponding measures of independence. Following this framework we explore a new measure of independence and apply it in the context of linear independent component analysis (ICA). An attractive property of the proposed method is that it does not involve any free parameter and we demonstrate that it performs equally well compared to the existing methods for ICA.
  • Keywords
    independent component analysis; learning (artificial intelligence); signal processing; ITL; density function; independence quadratic measurement; information theoretic learning; linear ICA; linear independent component analysis; random variable; signal processing; symmetric strictly positive-definite kernel; Biomedical measurements; Context; Electronic mail; Independent component analysis; Joints; Kernel; Random variables; Independent component analysis; information theoretic learning; kernel methods; quadratic measure; statistical independence; strictly positive-definite kernel; test of independence;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/TSP.2011.2153197
  • Filename
    5765725