Title :
Discard wide-baseline mismatch using contour fragments
Author :
Tao, C. ; Tan, Y.-H. ; Wang, Y.T. ; Tian, J.-W.
Author_Institution :
State Key Lab. for Multi-spectral Inf. Process. Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
A method to discard wide-baseline mismatches, which is based on the consistence of local contour fragments between two matched regions, is presented. Experimental results show that the proposed approach can efficiently extract high-precision matches from low-precision initial SIFT matches and performs best, or close to best, in comparison with state-of-the-art methods.
Keywords :
feature extraction; image matching; transforms; SIFT matches; local contour fragments; wide-baseline image matching methods; wide-baseline mismatch;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.1128