DocumentCode :
1514763
Title :
High order FE derivatives versus geometric parameters. Implantation on an existing code
Author :
Nguyen, Thanh Nam ; Coulomb, Jean-Louis
Author_Institution :
CNRS, Univ. Joseph Fourier, Grenoble, France
Volume :
35
Issue :
3
fYear :
1999
fDate :
5/1/1999 12:00:00 AM
Firstpage :
1502
Lastpage :
1505
Abstract :
In this paper, the authors present the design of a high order sensitivity analysis that is realised in an existing large FE code. They are interested in the implantation in that respect as much as possible of the original FE program structure and the existing classical tools. The goal is then to obtain the Taylor´s development of solution (and of all basic entities) that reports to the sensitivity parameters. The mesh derivation module and the parametrized FE solving stage are the two main design steps here. Many tools have been introduced for accelerating the expensive parametrized calculus. Once the parametrized solution is established, the rapidity of its evaluation could increase the utility of FE analysis and allows to realise some new applications. For one of those possibilities, they propose here a procedure that will allow one to define the device equivalent model from the results of parametrized analysis
Keywords :
electromagnetic field theory; finite element analysis; sensitivity analysis; EM field analysis; design steps; device equivalent model; geometric parameters; high order sensitivity analysis; high-order finite element derivatives; mesh derivation module; parametrized FE solving stage; parametrized analysis; Acceleration; Assembly; Calculus; Convergence; Equations; Iron; Magnetic fields; Polynomials; Sensitivity analysis; Shape;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.767252
Filename :
767252
Link To Document :
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