• DocumentCode
    1514812
  • Title

    Guest Editors´ Introduction: Yield Learning Processes and Methods

  • Author

    Gattiker, Anne ; Nigh, Phil

  • Author_Institution
    IBM,
  • Volume
    29
  • Issue
    1
  • fYear
    2012
  • Firstpage
    6
  • Lastpage
    7
  • Abstract
    The articles in this special section are devoted to the topic yield learning processes and methods.
  • Keywords
    Failure analysis; Fault diagnosis; Learning systems; Machine learning; Special issues and sections; Yield estimation;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2011.2180958
  • Filename
    6198439
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1514812