Title :
D-Fiber antenna characterization using finite-element analysis
Author :
Bhatti, Ajaz ; Al-Raweshidy, Hamed S. ; Murtaza, G.
Author_Institution :
Manchester Metropolitan Univ., UK
fDate :
8/1/2001 12:00:00 AM
Abstract :
An all-fiber antenna using piezoelectric polymer coated circular core D-fiber has been characterized using finite-element analysis. The response of the D-fiber antenna was determined over a wide frequency range from 1 MHz to 2 GWz. The modeling predicts an electric field induced phase shift of 2.43×10-6 rad/(V/m) per meter at 5 MHz. At frequencies higher than 8 MHz, the optical response is dominated by radial resonances of the D-fiber/coating composite. Using the simulation results, a minimum detectable electric field of 41 μV/m has been achieved using a 1 km length of coated D-fiber. In addition, a D-fiber antenna network intended for microcellular communications has been analyzed using shot noise limited detection. The D-fiber antenna has potential applications in areas such as electromagnetic compatibility testing and radio-over-fiber networks where it provides a convenient means of optically generating radio signals
Keywords :
finite element analysis; frequency response; microcellular radio; mobile antennas; optical fibre cladding; optical fibre communication; optical fibre networks; optical modulation; optical noise; phase modulation; shot noise; 1 MHz to 2 GHz; 1 km; D-fiber antenna network; D-fiber/coating composite; acousto-optic interaction; all-fiber antenna; electric field induced phase shift; electromagnetic compatibility testing; finite-element analysis; frequency response; microcellular communications; minimum detectable electric field; optical response; piezoelectric polymer coated circular core D-fiber; radial resonances; radio signal optical generation; radio-over-fiber networks; shot noise limited detection; simulation results; Coatings; Electromagnetic compatibility; Finite element methods; Frequency; Gunshot detection systems; Optical noise; Polymer films; Predictive models; Resonance; Testing;
Journal_Title :
Quantum Electronics, IEEE Journal of