DocumentCode
1514858
Title
Wafer-Level Packages Using Anisotropic Conductive Adhesives (ACAs) Solution for Flip-Chip Interconnections
Author
Kim, Il ; Jang, Kyung-Woon ; Son, Ho-Young ; Kim, Jae-Han ; Paik, Kyung-Wook
Author_Institution
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Volume
1
Issue
5
fYear
2011
fDate
5/1/2011 12:00:00 AM
Firstpage
792
Lastpage
797
Abstract
In this paper, wafer-level packages (WLPs) using an anisotropic conductive adhesives (ACAs) solution have been newly developed for flip-chip interconnections. WLPs using ACAs (ACA-WLPs) reduce processing steps compared to WLPs using anisotropic conductive films (ACFs), because ACA solution is directly coated on a wafer without an ACF formation process on the releasing film and an ACF lamination process on the wafer. The effects of ACA coating process parameters, such as blade gap and temperature, were first investigated for a uniform thickness coating without voids on an Au-bumped wafer. After solvent drying and subsequent singulation of a B-stage ACA-coated wafer, a singulated chip was flip-chip assembled on an organic substrate using a thermo-compression bonding method. The reliabilities of flip-chip assemblies using ACA-WLPs were evaluated in terms of a high temperature/humidity test, thermal cycling test, and pressure cooker test (PCT) and compared with corresponding results of conventional ACF flip-chip assemblies. In the high temperature/humidity reliability test and thermal cycling test, there was no difference in the flip-chip reliabilities between the two types of flip-chip assemblies. Furthermore, the flip-chip assemblies using ACA-WLPs showed better PCT reliability than the conventional ACF flip-chip assemblies.
Keywords
adhesives; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; wafer level packaging; ACA coating process; ACA-WLP; ACF formation process; ACF lamination process; B-stage ACA-coated wafer; PCT; PCT reliability; anisotropic conductive adhesive solution; anisotropic conductive films; flip-chip assembly; flip-chip interconnections; flip-chip reliability; organic substrate; pressure cooker test; singulated chip; solvent drying; temperature-humidity reliability test; thermal cycling test; thermo-compression bonding method; wafer-level packages; Additives; Assembly; Blades; Bonding; Coatings; Solvents; Substrates; Adhesive solutions; anisotropic conductive adhesives; flip chip assembly; interconnections; reliability; wafer level packages;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2011.2120609
Filename
5766021
Link To Document