• DocumentCode
    1515000
  • Title

    A polynomial time algorithm for the local testability problem of deterministic finite automata

  • Author

    Kim, Sam M. ; McNaughton, Robert ; McCloskey, Robert

  • Author_Institution
    Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
  • Volume
    40
  • Issue
    10
  • fYear
    1991
  • fDate
    10/1/1991 12:00:00 AM
  • Firstpage
    1087
  • Lastpage
    1093
  • Abstract
    The local testability problem of deterministic finite automata is investigated. A locally testable language is a language with the property that, for some nonnegative integer k, whether or not a word w is in the language depends on (1) the prefix and suffix of w of length k, and (2) the set of substrings of w length k+1, without regard to the order in which these substrings occur. The local testability problem is, given a deterministic finite automation, to decide whether or not it accepts a locally testable language. The authors present an O(n 2) time algorithm for the local testability problem based on two simple properties that characterize locally testable automata
  • Keywords
    computational complexity; deterministic automata; finite automata; formal languages; deterministic finite automata; local testability; locally testable language; nonnegative integer; polynomial time algorithm; prefix; substrings; suffix; word; Automata; Automatic testing; Computer science; Image recognition; Information science; Integrated circuit testing; Pattern recognition; Polynomials;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.93741
  • Filename
    93741