DocumentCode :
1515295
Title :
Design-for-Debug Architecture for Distributed Embedded Logic Analysis
Author :
Ko, Ho Fai ; Kinsman, Adam B. ; Nicolici, Nicola
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, ON, Canada
Volume :
19
Issue :
8
fYear :
2011
Firstpage :
1380
Lastpage :
1393
Abstract :
In multi-core designs, distributed embedded logic analyzers with multiple trigger units and trace buffers with real-time offload capability through high-speed trace ports can be placed on-chip. This brings new challenges on how to connect the debug units together in such way that the limited storage space in the trace buffers can be used efficiently. This problem is further aggravated when shadow registers are used to capture data for some signals in the design. In this paper, we propose a new architecture that can dynamically allocate the trace buffers at runtime based on the needs for debug data acquisition coming from multiple data sources and user-programmable priorities. Experimental results show that using the proposed architecture, real-time observability can be improved using only a small amount of on-chip logic hardware, while avoiding excessive storage on-chip.
Keywords :
buffer circuits; data acquisition; electronic engineering computing; embedded systems; logic design; program debugging; real-time systems; storage management chips; system-on-chip; trigger circuits; debug data acquisition; debug units; design-for-debug architecture; distributed embedded logic analysis; distributed embedded logic analyzers; high-speed trace ports; limited storage space; multicore designs; multiple data sources; multiple trigger units; on-chip logic hardware; real-time observability; real-time offload capability; shadow registers; storage on-chip; trace buffers; user-programmable priority; Buffer storage; Circuits; Computer bugs; Data acquisition; Logic design; Manufacturing; Observability; Signal design; System-on-a-chip; Testing; Design-for-debug; distributed embedded logic analysis; post-silicon validation; real-time observability;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2050501
Filename :
5484451
Link To Document :
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