DocumentCode :
1515628
Title :
Evaluation of a Numerical Modeling Approach Based on the Finite-Element Method for Calculating the Rough Surface Scattering and Emission of a Soil Layer
Author :
Lawrence, Heather ; Demontoux, François ; Wigneron, Jean-Pierre ; Paillou, Philippe ; Wu, Tzong-Dar ; Kerr, Yann H.
Author_Institution :
Lab. de l´´Integration du Materiau au Syst., Univ. of Bordeaux 1, Pessac, France
Volume :
8
Issue :
5
fYear :
2011
Firstpage :
953
Lastpage :
957
Abstract :
We evaluate a new 3-D numerical modeling approach for calculating the rough-surface scattering and emission of a soil layer. The approach relies on the use of Ansoft´s numerical computation software High-Frequency Structure Simulator, which solves Maxwell´s equations directly using the finite-element method. The interest of this approach is that it can be easily extended to studies of heterogeneous media. However, before being applied in this way, it must first be validated for the rough-surface case. In this letter, we perform this validation by comparing the results of rough-surface scattering and emission with the results of the method of moments (MoM) for a range of different roughness and permittivity conditions and with both Gaussian and exponential rough-surface autocorrelation functions. For the scattering case, we obtain results that are in agreement with the MoM to within approximately 1-3 dB for angles up to and including 40° and 2-4 dB for angles from 50° to 70°. Agreement for emissivity is to within 3.2 and 3.6 K for low and high roughness conditions, respectively. We then illustrate the application of the new approach by calculating the emission of a two-layer system with rough surfaces, representing the soil-litter system in forests.
Keywords :
finite element analysis; geophysical techniques; method of moments; soil; Maxwell equations; electromagnetic scattering; finite-element method; high-frequency structure simulator; method-of-moments; numerical computation software; numerical modeling; permittivity conditions; rough surface scattering; rough-surface autocorrelation functions; soil layer; soil-litter system; two-layer system; Finite element methods; Moment methods; Numerical models; Rough surfaces; Scattering; Surface impedance; Surface roughness; Electromagnetic scattering by rough surfaces; microwave emissivity; numerical simulation;
fLanguage :
English
Journal_Title :
Geoscience and Remote Sensing Letters, IEEE
Publisher :
ieee
ISSN :
1545-598X
Type :
jour
DOI :
10.1109/LGRS.2011.2131633
Filename :
5766708
Link To Document :
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